We use Cookies to give you best experience on our website. By using our website and services, you expressly agree to the placement of our performance, functionality and advertising cookies. Please see our Privacy Policy for more information. Pin , frequency. The latch can be reset by power cycling.

Author:Bazshura Shaktira
Language:English (Spanish)
Published (Last):28 January 2013
PDF File Size:12.99 Mb
ePub File Size:5.54 Mb
Price:Free* [*Free Regsitration Required]

Product Summary. Continuous drain current. Pulsed drain current. Avalanche energy, single pulse. Gate source voltage 4. Power dissipation. Operating and storage temperature. Thermal characteristics.

Thermal resistance, junction - case. Static characteristics. Drain-source breakdown voltage. BR DSS. Gate threshold voltage. GS th. Zero gate voltage drain current. I DSS. Gate-source leakage current. I GSS. Drain-source on-state resistance. DS on. SMD version. Gate resistance. Dynamic characteristics. Input capacitance. Output capacitance. Reverse transfer capacitance. Turn-on delay time. Rise time. Turn-off delay time. Fall time. Gate Charge Characteristics 6. Gate to source charge.

Gate charge at threshold. Gate to drain charge. Switching charge. Gate charge total. Gate plateau voltage. Gate charge total, sync. Output charge. Reverse Diode. Diode continous forward current. Diode pulse current.

Diode forward voltage. Reverse recovery charge. I D [A]. C [pF]. Package Outline. All Rights Reserved.

Attention please! Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office www. Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office.

Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system.

If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Learn more about Scribd Membership Home. Much more than documents.

Discover everything Scribd has to offer, including books and audiobooks from major publishers. Start Free Trial Cancel anytime. Uploaded by Mihai Ganea. Document Information click to expand document information Description: pc component.

Date uploaded May 01, Did you find this document useful? Is this content inappropriate? Report this Document. Description: pc component. Flag for Inappropriate Content.

Download Now. Related titles. Carousel Previous Carousel Next. Jump to Page. Search inside document. P tot [W]. V DS [V]. R DS on. R DS on [m. V GS th [V]. V SD [V]. I F [A]. I AV [A]. V GS [V]. Q gate. PG-TO Outline. Dante Cruz. Richard Lee. Rafael Hurtado. Ivan Ignacio Montecino Bacigalupo. Dwi Tjitoson. Orlando Williams. Cristian Bandila. Indranil Chakraborty. Patrick Famini. Swapnil agrawal. Anselmo Antunes.

Zhixiong Wu. Didi Conan. Popular in Technology. Analog Communication Interview Questions and Answers. Zaheer Ahmed Swati. Ayesha Nadeem.


Datasheets search archive of electronic components datasheets


16F716 PDF

09N03LA Datasheet PDF



IPI09N03LA MOSFET. Datasheet pdf. Equivalent


Related Articles